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Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages
Tang, X.; Raffo, A.; Donato, N.; Crupi, G.; Cai, J.     dettagli >>
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 43, No. 3, pp: 933-943, Anno: 2024

Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S22and h21: An Effective Machine Learning Approach
Zhu, Z.; Bosi, G.; Raffo, A.; Crupi, G.; Cai, J.     dettagli >>
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 12, No. 1, pp: 201-210, Anno: 2024

A Systematic and Numerical Methodology for GaN HEMT Current-Gain Peak Analysis Using the Complex Lorentzian Function
Gugliandolo, G; Crupi, G; Vadala, V; Raffo, A; Donato, N; Vannini, G     dettagli >>
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
Vol. 33, No. 7, pp: 1007-1010, Anno: 2023

Active Balun Design for Next-Generation Telecom Satellite Frequency Converters
Resca, D.; Bosi, G.; Biondi, A.; Cariani, L.; Vadala, V.; Scappaviva, F.; Raffo, A.; Vannini, G.     dettagli >>
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 33, No. 2, pp: 165-168, Anno: 2023

A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements (Invited Paper)
Crupi, G.; Latino, M.; Gugliandolo, G.; Marinkovic, Z.; Cai, J.; Bosi, G.; Raffo, A.; Fazio, E.; Donato, N.     dettagli >>
ELECTRONICS
Vol. 12, No. 8, pp: 1771-1-1771-15, Anno: 2023

Harmonic Included CSWPL Model for Broadband PA Design Based on GaN HEMTs
Tang, X.; Raffo, A.; Crupi, G.; Cai, J.     dettagli >>
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. --, No. 1, pp: 1-9, Anno: 2023

A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation
Bosi, G.; Raffo, A.; Vadala, V.; Giofre, R.; Crupi, G.; Vannini, G.     dettagli >>
ELECTRONICS
Vol. 12, No. 13, pp: 2939-2956, Anno: 2023

Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers
Yamamoto, H.; Kikuchi, K.; Vadala, V.; Bosi, G.; Raffo, A.; Vannini, G.     dettagli >>
IEICE TRANSACTIONS ON ELECTRONICS
Vol. E105C, No. 10, pp: 449-456, Anno: 2022

Equivalent-circuit extraction for gallium nitride electron devices: Direct versus optimization-empowered approaches
Jarndal, A.; Crupi, G.; Alim, M. A.; Vadala, V.; Raffo, A.; Vannini, G.     dettagli >>
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS
Vol. 35, No. 5, pp: e3008-1-e3008-11, Anno: 2022

Advances in Ku-Band GaN Single Chip Front End for Space SARs: From System Specifications to Technology Selection
Scappaviva, F.; Bosi, G.; Biondi, A.; D'Angelo, S.; Cariani, L.; Vadala, V.; Raffo, A.; Resca, D.; Cipriani, E.; Vannini, G.     dettagli >>
ELECTRONICS
Vol. 11, No. 19, pp: 2998-3007, Anno: 2022

An Improved Transistor Modeling Methodology Exploiting the Quasi-Static Approximation
Jarndal, A.; Crupi, G.; Raffo, A.; Vadala', V.; Vannini, G.     dettagli >>
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 9, No. 1, pp: 378-386, Anno: 2021

2-mm-gate-periphery GaN high electron mobility transistors on SiC and Si substrates: A comparative analysis from a small-signal standpoint
Jarndal, A.; Alim, M. A.; Raffo, A.; Crupi, G.     dettagli >>
INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
Vol. 31, No. 6, pp: e22642-1-e22642-12, Anno: 2021

A New Modeling Technique for Microwave Multicell Transistors Based on EM Simulations
Raffo, A.; Vadala, V.; Yamamoto, H.; Kikuchi, K.; Bosi, G.; Ui, N.; Inoue, K.; Vannini, G.     dettagli >>
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Vol. 68, No. 7, pp: 3100-3110, Anno: 2020

Scalability of Multifinger HEMT Performance
Crupi, G.; Raffo, A.; Vadala, Valeria; Vannini, G.; Schreurs, D. M. M. -P.; Caddemi, A.     dettagli >>
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 30, No. 9, pp: 869-872, Anno: 2020

An ultra-wideband sensing board for radio frequency front-end in IoT transmitters
Petrocchi, A.; Raffo, A.; Bosi, G.; Avolio, G.; Resca, D.; Vannini, G.; Schreurs, D.     dettagli >>
ELECTRONICS
Vol. 8, No. 10, pp: 1191-1-1191-16, Anno: 2019

A streamlined drain-lag model for GaN HEMTs based on pulsed S-parameter measurements
Luo, Peng; Schnieder, Frank; Bengtsson, Olof; Vadalà, Valeria; Raffo, Antonio; Heinrich, Wolfgang; Rudolph, Matthias     dettagli >>
INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES
Vol. 11, No. 2, pp: 121-129, Anno: 2019

Nonlinear-embedding design methodology oriented to LDMOS power amplifiers
Bosi, Gianni; Raffo, Antonio; Trevisan, Francesco; Vadala, Valeria; Crupi, Giovanni; Vannini, Giorgio     dettagli >>
IEEE TRANSACTIONS ON POWER ELECTRONICS
Vol. 33, No. 10, pp: 8764-8774, Anno: 2018

A new study on the temperature and bias dependence of the kink effects in S22 and h21 for the GaN HEMT technology
Crupi, Giovanni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Caddemi, Alina     dettagli >>
ELECTRONICS
Vol. 7, No. 12, pp: 353-1-353-11, Anno: 2018

High-periphery GaN HEMT modeling up to 65 GHz and 200 °C
Crupi, Giovanni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Caddemi, Alina     dettagli >>
SOLID-STATE ELECTRONICS
Vol. 152, No. 1, pp: 11-16, Anno: 2018

Assessing GaN FET Performance Degradation in Power Amplifiers for Pulsed Radar Systems
Raffo, Antonio; Avolio, Gustavo; Vadala', Valeria; Bosi, Gianni; Vannini, Giorgio; Schreurs, Dominique     dettagli >>
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 28, No. 11, pp: 1035-1037, Anno: 2018

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